Common Techniques Used to Characterize Nano-Crystalline Thin Films

Published in Journal

Journal of Advances in Science and Technology [JAST] (Vol:4/ Issue: 7) DOI: 10.29070/JAST
Authors: Baljinder Singh*,
Subjects: Science & Technology

Year: Nov, 2012
Volume: 4 / Issue: 7
Pages: 0 - 0 (0)
Publisher: Ignited Minds Journals
Source:
E-ISSN: 2230-9659
DOI:
Published URL: http://ipublisher.in/p/4959
Published On: Nov, 2012

Article Details

Common Techniques Used to Characterize Nano-Crystalline Thin Films | Original Article

Baljinder Singh*, in Journal of Advances in Science and Technology | Science & Technology

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ABSTRACT:

This paper presents some important techniqueslike X-ray diffraction, scanning electron microscopy, energy dispersive analysis of X-ray, optical transmission measurement, which are commonly used to characterized nano-crystalline thin films. Structural parameters like crystallite size, micro-strain, grain size, stoichiometric composition of constituted elements, and optical band gap etc. which are dependent upon these techniques also highlighted briefly.