This Paper Presents some Important Techniqueslike X-Ray Diffraction, Scanning Electron Microscopy, Energy Dispersive Analysis of X-Ray, Optical Transmission Measurement, Which Are Commonly Used to Characterized Nano-Crystalline Thin Films. Structural Parameters Like Crystallite Size, Micro-Strain, Grain Size, Stoichiometric Composition of Constituted Elements, and Optical Band Gap Etc. Which Are Dependent Upon These Techniques Also Highlighted Briefly.